| Nr. | Part Name | Description | Manufacturer |
| 1 | 1468373 | Bobbin Type Inductors | C&D Technologies |
| 2 | CY28373 | Universal Single Chip Clock Solution for SiS658 Pentium®4 | Cypress |
| 3 | G8373-01 | InGaAs PIN photodiode | Hamamatsu Corporation |
| 4 | G8373-03 | InGaAs PIN photodiode | Hamamatsu Corporation |
| 5 | SCAN18373T | Transparent Latch with TRI-STATE Outputs | National Semiconductor |
| 6 | SCAN18373T | Transparent Latch with 3-STATE Outputs | Fairchild Semiconductor |
| 7 | SCAN18373TSSC | Transparent Latch with 3-STATE Outputs | Fairchild Semiconductor |
| 8 | SCAN18373TSSCX | Transparent Latch with 3-STATE Outputs | Fairchild Semiconductor |
| 9 | SN54BCT8373A | Scan Test Devices With Octal D-type Latches | Texas Instruments |
| 10 | SN54BCT8373AFK | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas Instruments |
| 11 | SN54BCT8373AJT | SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | Texas Instruments |
| 12 | SN74BCT8373A | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Texas Instruments |
| 13 | SN74BCT8373ADW | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Texas Instruments |
| 14 | SN74BCT8373ADWR | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Texas Instruments |
| 15 | SN74BCT8373ANT | IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches | Texas Instruments |
| 16 | SNJ54BCT8373AFK | Scan Test Devices With Octal D-type Latches | Texas Instruments |
| 17 | SNJ54BCT8373AJT | Scan Test Devices With Octal D-type Latches | Texas Instruments |
| 18 | TDA8373 | I2C-bus controlled economy PAL/NTSC and NTSC TV-processors | Philips |
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